High-precision positioning systems for laboratory microscopy
We develop customer-specific positioning solutions for your high-precision microscopy applications such as digital microscopy, fluorescence microscopy, atomic force microscopy (AFM) and others. For this, we offer upfront technical consultation, free 3D designs and cost-optimized prototypes. The here shown systems can also be individually adapted to your microscopy process.
Configure the solution for your applications now
Inform us abour your exact requirements online, so that you can reach your targets as soon as possible.
Highest dynamics for your analysis processes
Reduce lead times and increase quality with reproducible results
2D and 3D
for various measurement applications
For a wide variety of samples and the smallest details in the submicrometer range
under extreme conditions
HV, UHV, EUV, radiation or extreme temperatures