Inspection and Mikroscopy

We provide you with the fully tested infrastructure to manufacture machines developed together with you. For example, we can put your sensor technology into practice, construct the basic structure and the casing, install the necessary safety devices, install the software and test the functions you require.

XYZ Positioning System for wafer inspection up to 12 inch / 300 mm (cleanroom ISO 6) | travel 305 x 305 x 200 mm
XYZ Positioning System for wafer inspection up to 12 inch / 300 mm (cleanroom ISO 6) | travel 305 x 305 x 200 mm
XYZ positioning system for optical inspection of wafers, PCBs, probe cards (clean room) | Stroke 200 x 200 mm
XYZ positioning system for optical inspection of wafers, PCBs, probe cards (clean room) | Stroke 200 x 200 mm
2X-Y-Ys (XYZ) positioning system for wafer inspection / Raman spectroscopy up to 12"/ panel (cleanroom ISO 4) | travel 400 x 400 mm
2X-Y-Ys (XYZ) positioning system for wafer inspection / Raman spectroscopy up to 12"/ panel (cleanroom ISO 4) | travel 400 x 400 mm
6-axis semiconductor inspection positioning system (clean room class ISO 4) | travel XYZ 30 x 30 x 20 mm, RxRy 4°, Rz 360°
6-axis semiconductor inspection positioning system (clean room class ISO 4) | travel XYZ 30 x 30 x 20 mm, RxRy 4°, Rz 360°
Double XYZ wafer positioner for scanners, microscopes and wafers up to 12 inch / 300 mm (clean room ISO2) | Stroke 720 x 720 x 100 mm
Double XYZ wafer positioner for scanners, microscopes and wafers up to 12 inch / 300 mm (clean room ISO2) | Stroke 720 x 720 x 100 mm
XYZ positioning system for inspection & metrology by laser, optics e.g. solar cells, wafers | Stroke 1200 x 1400 x 200 mm
XYZ positioning system for inspection & metrology by laser, optics e.g. solar cells, wafers | Stroke 1200 x 1400 x 200 mm
XYZ positioning system for automated inline wafer inspection e.g. layer thickness measurement | Stroke 650 x 650 x 100 mm
XYZ positioning system for automated inline wafer inspection e.g. layer thickness measurement | Stroke 650 x 650 x 100 mm
XYZ positioning system for automated inspection - wafer / probe cards (clean room) | Stroke 720 x 720 x 100 mm
XYZ positioning system for automated inspection - wafer / probe cards (clean room) | Stroke 720 x 720 x 100 mm
XYZ Inspection gantry for semiconductors | XY Linear motor, profile rail | Z Ball screw, AC servo
XYZ Inspection gantry for semiconductors | XY Linear motor, profile rail | Z Ball screw, AC servo
X Phi positioning system for inspection of wafers, biological samples (clean room ISO 5) | rotary axis and linear stage
X Phi positioning system for inspection of wafers, biological samples (clean room ISO 5) | rotary axis and linear stage
XYZ Phi inspection system suitable for 12 inch wafers, printed circuit boards (clean room ISO 2)
XYZ Phi inspection system suitable for 12 inch wafers, printed circuit boards (clean room ISO 2)
9-axis microscopy station for high-resolution, automated imaging | XYZ Phi Theta Omega positioning system
9-axis microscopy station for high-resolution, automated imaging | XYZ Phi Theta Omega positioning system
Mobile microscope stand for rollers | Measurement of cylindrical, large, sensitive specimens
Mobile microscope stand for rollers | Measurement of cylindrical, large, sensitive specimens
Mobile microscope stand for large plates | Measurement of large, light and sensitive specimens
Mobile microscope stand for large plates | Measurement of large, light and sensitive specimens
Phi-Theta 3D Scanner | Rotational Positioning System for the Inspection of Contact Lenses (living transplants and synthetics)
Phi-Theta 3D Scanner | Rotational Positioning System for the Inspection of Contact Lenses (living transplants and synthetics)
Circular Measuring Gauge for concentricity, circularity and cylindricity | measuring range: max. length 400 mm / Ø 35 mm
Circular Measuring Gauge for concentricity, circularity and cylindricity | measuring range: max. length 400 mm / Ø 35 mm
EMC Measuring Machine
EMC Measuring Machine
Inspection System for Solar Wafers
Inspection System for Solar Wafers
Rotary unit for 3D interior inspection | Phi positioning system for diesel engine inspection
Rotary unit for 3D interior inspection | Phi positioning system for diesel engine inspection
Measuring System for Pitch Errors of Ball Screw Drives
Measuring System for Pitch Errors of Ball Screw Drives

Angepasstes System für Ihr Gesamtkonzept

Are you looking for a technical solution for your application?

Get your first 3D Design in a few days:

 

Katja Weißbach
Consulting

T +49 351 88585-64
E-Mail

Ronald Schulze
Consulting, Project Management & Engineering
T +49 351 88585-67
E-Mail

 

Francisco Samuel
Consulting &
Project Management
T +49 351 88585-85
E-Mail

 

Elger Matthes
Consulting, Concepts, Innovation & Engineering
T +49 351 88585-82
E-Mail

Our references