Custom Positioning Systems

Inspection System for Solar Wafers
Inspection and Mikroscopy

782460:001.26

A KT310 form our standard program was combined with a rotation stage carrying a vacuum chuck. A light barrier senses the edges of the wafer an the chuck. The setup is being used for laser structuring of solar cells.

Controllers

FMC 220

Versatile combinable controller, ideal for laboratory applications, control of 1 - 128 axes simultaneously

FMC400/450

Multi-axis controller fully ready for tracking, simple creation of own programs.

PLC

We support integration of our systems into PLC architectures, e.g. Beckhoff

Used Standard Components

KT305-EDLM

Precision XY scanning stage with 210 mm travel, 0.3 µm repeatability, 80 N load

Customize system

Are you looking for a technical solution for your application?

Get your first 3D Design in a few days:

Elger Matthes
Development, Consulting, Concepts, Innovationn

T +49 (0) 351 88585-0

Nadine Strudel
Consulting International

T +49 (0) 351 88585-44

Our references