Inspection System for Solar Wafers
Inspection

782460:001.26

A KT310 form our standard program was combined with a rotation stage carrying a vacuum chuck. A light barrier senses the edges of the wafer an the chuck. The setup is being used for laser structuring of solar cells.

Controllers

FMC 220

Compact controller for laboratory applications with separate power supply. Ideally up to 3 axes.

Standard Components Used

KT305-EDLM

Precision XY scanning stage with 210 mm travel, 0.3 µm repeatability, 80 N load

Customize system

1. Your customized system
2. System
3. [Umwelt]
4. [Verfahrweg]
5. [Last]
6. kleinster Stellschritt = Wiederholbarkeit (µm)
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Are you looking for the best technical solution?

Get your first 3D design in just a few days:

Dipl.-Ing. Elger Matthes

Phone: +49 (0) 351 88585-0

elger.matthes(at)steinmeyer.com

Inspection System for Solar Wafers Inspection