Universal 4-axis granite gantry with cleanroom housing

This XYZ Phi positioning system can be used for various test and inspection processes in semiconductor and electronics manufacturing up to cleanroom class ISO 2. Due to the design of the travels up to 320 x 320 mm in XY, it is suitable for all standard wafer sizes up to 12 inches. Samples are manipulated with high precision to a laser, sensor or camera in the Z-axis using the linear motor-driven KT405-320-EDLM mechanical stage. The sensor or camera is adjusted in vertical movement (maximum 50 mm) with the PMT160-050-DC-R/L precision measuring stage, which can optionally be added with a swivel unit.

High-precision testing in demanding cleanrooms

Individual extensions and customizations

Engineering services include the fitting of the systems to your structure and the desired controlls. Furthermore, we develop prototypes and like to adapt the systems to the environmental requirements of your application particle emission, radiation, temperature, precision special parts manufacturing, working height, collision protection, safety concept, compensation factor and filter, sensor mounting, brake, decoupling, special lubrication, special colors, holders, adapters, special motors with pharmaceutical approval, comprehensive documentation, test protocoll, llife cycle tests

Fields of application

Assembly / inspection / quality assurance of 12 inch wafers, chipping / crack / defect detection, surface inspection, layer thickness measurement with one sensor, inspection of chips, dies, pins, bonding, printed circuit boards, solar cells