XYZ positioning system for automated inspection - wafer / probe cards (clean room), long travels up to 720 mm
Inspection

782300:148.26

High-precision quality inspection for cleanroom applications

This inspection system (shown here without cover) is specially designed for automated quality assurance of large wafers, probe cards and printed circuit boards. The positioning system allows positioning along two linear axes. A high-resolution camera or sensor is moved relative to the sample to inspect geometries, perform measurements and document special quality features. The system is controlled by a separate motion controller for three axes.

Increased throughput by automated and low-maintenance 24/7 inspection

  • Simultaneous inspection of multiple 400 x 400 mm wafers, probe cards and printed circuit boards through travels up to 820 mm
  • Reduced cycle time with speeds up to 150 mm/s and accelerations of 2 m/s2
  • Precise measurement results and enormous quality improvements with repeatability up to 1 µm
  • Low-maintenance 24/7 operation and flexible maintenance concept due to fast system exchange on the granite structure

Optionally expandable:

  • Various travels up to 720 mm
  • Version for clean room ISO 14644-1 (up to class 1 on request)
  • Optionally with motorized Z-axis
  • Connections for dust extraction and rotating belt covers
  • With/without frame and base plate made of granite or aluminum
  • Integration into the customer specific application
  • Immediate use with pre-configured controller incl. exemplary software

    Individual extensions and customizations

    Engineering services include the fitting of the systems to your structure and the desired controlls. Furthermore, we develop prototypes and like to adapt the systems to the environmental requirements of your application particle emission, radiation, temperature, precision special parts manufacturing, working height, collision protection, safety concept, compensation factor and filter, sensor mounting, brake, decoupling, special lubrication, special colors, holders, adapters, special motors with pharmaceutical approval, comprehensive documentation, test protocoll, llife cycle tests

     

    Fields of application

    Inspection of large wafers, probe cards and printed circuit boards, AOI, quality assurance, microscopy of large sample, surface inspection, measurement of chip, measurement of objects on complicated geometric shapes

    782300:148.26

    X

    Y

    Z

    Standard system usedPMT290-EDLMPMT290-EDLM
    Travel

    [mm; deg]

    820 820 100

    Repeatability unidirectional

    [µm; deg]

    ± 0.3 ± 0.5 ± 0.5

    Repeatability bidirectional

    [µm; deg]

    ± 0.4 ± 0.7 ± 0.7

    Positioning speed

    [mm/s; deg/s]

    750 750 150

    Max. Load

    [N]

    70 70 ± 270

    Motor

     

    Ironless Dynamic Linear Motor

     

    Ironless Dynamic Linear Motor

     

     

     

    Drive

     

     

     

    manual (optionally motorized)

    Guide Profile rail Profile rail

    Feedback

    Linear Scale

     

    Linear Scale

     

     

     

    Specifications are subject to change. Values are for the single axis with our controller. Parameters shown here are typical values for a standard configuration. By customization and given in depth knowledge of your application significantly improved values can be achieved.


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    Dipl.-Ing. Elger Matthes

    Phone: +49 (0) 351 88585-0

    elger.matthes(at)steinmeyer.com