Inspection System for Solar Wafers
Inspection and Mikroscopy

782460:001.26
Inspection System for Solar Wafers - Inspection and Mikroscopy

A KT310 form our standard program was combined with a rotation stage carrying a vacuum chuck. A light barrier senses the edges of the wafer an the chuck. The setup is being used for laser structuring of solar cells.

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Dipl.-Ing. Elger Matthes

Phone: +49 (0) 351 88585-0

elger.matthes(at)steinmeyer.com