For you we find customized solutions for non-contact optical inspection of wafers, probe cards, dies and microchip components. For this purpose, we offer systems for layer thickness measurement, contact inspection, electrical characterization, probe head positioning, sample manipulation and metrology of wafer microstructures in the nanometer range.
Series production of your innovation on > 3.900 m² production area
On more than 100 m2 of cleanroom space, we exclusively manufacture high-precision and particle-free state-of-the-art technology for cleanroom systems up to ISO 14644-1 Class 1.
More on series development
Our high-precision modular vacuum axes have proven themselves over decades. They withstand the most extreme life tests with 24/7 operation in the submicron range. Go to Vacuum Standard axes
We implement your life cycle tests for you at our numerous universal test stands for various individual test scenarios in our measurement laboratories.
More about test and measurementWe are positioning your idea, no matter how unorthodox it is. Get in touch with us:
